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1

Measurement of the S-Parameters of 2n-Terminal Microwave Devices

Yu. V. Ryasnyi, Yu. A. Pal'chun

Journal:

Measurement Techniques

Year:

2001

Language:

english

File:

PDF, 60 KB

english, 2001

2

Analysis of a method of measuring theS-parameters of microwave transistors

Yu. V. Ryasnyi, M. S. Chashkov, A. V. Borisov

Journal:

Measurement Techniques

Year:

2013

Language:

english

File:

PDF, 136 KB

english, 2013

3

Estimate of total error of measuring instruments

V. P. Petrov, Yu. V. Ryasnyi

Journal:

Measurement Techniques

Year:

1977

Language:

english

File:

PDF, 81 KB

english, 1977

4

Measurement of voltage standing wave ratio in a 3.5×1.52-mm coaxial waveguide

Yu. V. Ryasnyi, O. B. Chemodanova

Journal:

Measurement Techniques

Year:

1981

Language:

english

File:

PDF, 296 KB

english, 1981

5

Analysis of methods of 12-pole reflectometer calibration

V. P. Petrov, Yu. V. Ryasnyi, O. B. Zhuravleva, V. P. Pologrudov

Journal:

Measurement Techniques

Year:

1985

Language:

english

File:

PDF, 298 KB

english, 1985

6

Multipole measuring transducers of microwave circuit analyzers

V. P. Petrov, Yu. V. Ryasnyi, O. B. Zhuravleva

Journal:

Measurement Techniques

Year:

1987

Language:

english

File:

PDF, 259 KB

english, 1987

7

Optimizing the structure of six-port transducers

Yu. V. Ryasnyi, O. B. Zhuravleva, V. P. Pologrudov

Journal:

Measurement Techniques

Year:

1991

Language:

english

File:

PDF, 226 KB

english, 1991

8

Analysis of calibration methods and design principles of switching multiport reflectometers

Yu. V. Ryasnyi, Yu. A. Pal'chun

Journal:

Measurement Techniques

Year:

1998

Language:

english

File:

PDF, 368 KB

english, 1998

9

Generalized analysis of multiport microwave measuring circuits

Yu. V. Ryasnyi, Yu. A. Pal'chun

Journal:

Measurement Techniques

Year:

1998

Language:

english

File:

PDF, 311 KB

english, 1998

10

Status of the LVD experiment

N. Yu. Agafonova, V. V. Boyarkin, V. L. Dadykin, R. I. Enikeev, V. A. Kuznetsov, V. V. Kuznetsov, A. S. Mal’gin, O. G. Ryazhskaya, V. G. Ryasnyi, V. F. Yakushev

Journal:

Bulletin of the Russian Academy of Sciences: Physics

Year:

2007

Language:

english

File:

PDF, 129 KB

english, 2007

11

Diode Detector Development for 12-Terminal UHF Circuit Analyzers

Yu. A. Pal'chun, Yu. V. Ryasnyi, O. B. Zhuravleva

Journal:

Measurement Techniques

Year:

2001

Language:

english

File:

PDF, 58 KB

english, 2001

12

Projects of the Siberian Scientific-Research Institute of Metrology (SNIIM) in the measurement of microwave circuit characteristics

V. P. Petrov, É. M. Gutina, Yu. V. Kondakov, A. I. Kalmykov, V. P. Konoplev, K. K. Kostyuchenko, Yu. V. Ryasnyi

Journal:

Measurement Techniques

Year:

1974

Language:

english

File:

PDF, 505 KB

english, 1974

13

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Design method for digital recursive filter with linear phase-frequency characteristic

Ryasnyi, Yu. V., Dezhina, E. V.

Year:

2012

Language:

russian

File:

PDF, 343 KB

russian, 2012

14

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis the method for setting digital equalizer

Ryasnyi, Yu. V., Dezhina, E. V.

Year:

2012

Language:

russian

File:

PDF, 222 KB

russian, 2012

15

[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Measurement of passive 6-pole element S-parameters by triple 12-pole reflectometer

Ryasnyi, Yu. V., Chashkov, M. S., Sapozhnikov, A. M.

Year:

2012

Language:

russian

File:

PDF, 376 KB

russian, 2012

16

[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Increased accuracy of microwave transistor S-parameters measurements

Ryasnyi, Yu. V., Chashkov, M. S.

Year:

2016

Language:

english

File:

PDF, 480 KB

english, 2016

17

Method of Determining the Reliability of Real-Time In-reactor Monitoring of VVER

Semenikhin, A. V., Saunin, Yu. V., Ryasnyi, S. I.

Journal:

Year:

2018

Language:

english

File:

PDF, 217 KB

english, 2018